Noise reduction in atomic force microscopy: Resonance contact mode
نویسندگان
چکیده
Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. We call this mode ‘‘resonance contact’’ mode. The nonlinear behavior of the tip–sample interaction allows the high frequency excitation to effectively broaden the frequency response of the system resonances. © 1996 American Institute of Physics. @S0034-6748~96!02602-8#
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